致茂電子3160-C是一臺可提供大量且多個(gè)IC測試的分類機(jī)。該設(shè)備可提供多種封裝方試的IC測試,且支持1/2/4 sites的測試需求。另外,由于可靠的機(jī)構(gòu)及功能設(shè)計(jì),也讓該設(shè)備能提供更高的產(chǎn)出及降低設(shè)備當(dāng)機(jī)率,3160-C能更有效提升生產(chǎn)力并縮短更換kit部件的時(shí)間,且主動式溫控系統(tǒng) (ATC)更可提供待測物-55°C to 150°C的測試環(huán)境。
Auto tray load / unload
Pre-soak
Test head
Rotator
Defrost
Programmable probe
規(guī)格表
Model
3160-C
Dimension (W x D x H)
2,300 mm x 1,850mm x 2,100mm
Weight
Approx. 1,650 kg
Facility
Power : AC220, 50/60 Hz single-phase, 10 KVA max. Dry air : -70℃ dew oint, 0.5 Mpa, 1,200 L/min. LN2 source : 0.35Mpa (50 Psi), consumption 0.6 kg/min.
Applicable Device
Type : BGA, QFP, CSP, QFN, Flip chip, TSOP, etc. Package size : 3 mm x 3 mm to 50 mm x 50 mm (Ball pitch > 0.35mm)
Contact mode
Direct contact / drop and press
Interface
Standard : TTL & GPIB Option : TCP/IP
Multiple Site
Single site (option) Dual sites : 1 x 2 (80 mm) Quad sites : 1 x 4 (40 mm) ; 2 x 2 (80 x 60 mm) Octal sites : 2 x 4 (40 x 60 mm)
Contact Area
Test Head Area : 600 mm (from socket center) Socket mounting height : 1,100 mm (1,200 mm option)
Index Time
0.6 sec. (excluding tester communication time),max. uph up to 3,200 at zero test time
Rotation Function (opation)
± 90? , ± 180?
Jam Rate
1/5,000 for ambient / hot / cold temperature mode
Category
7 categories (3 auto, 4 manual)
Contact Force
120 kgf
Thermal Range
Temperature range : -40℃ to 125℃ before contact (option : -55°C to 150°C before contact) Test head : set-point ± 3℃ before contact Pre-soak buffer and input shuttle : set-point ± 5℃ before contact